Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations
نویسندگان
چکیده
منابع مشابه
Forecasting Cost and Yield
At a Glance: This article describes a prototype of a discrete event simulator-Y4 (Yield Forecaster)-capable of simulating defect related yield loss as a function of time, for a multi-product IC manufacturing line. The methodology of estimating yield and cost is based on mimicking the operation and characteristics of a manufacturing line in the time domain. The effect of particles introduced dur...
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ژورنال
عنوان ژورنال: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
سال: 2017
ISSN: 0278-0070,1937-4151
DOI: 10.1109/tcad.2017.2669861